The Spectroscopic Ellipsometry Focus Topic integrates themes ranging from classical material science and thin film characterization to nanometer scale science and novel optical sensing concepts. We will host three oral sessions dedicated to traditional applications of spectroscopic ellipsometry in optical materials and thin film characterization as well as new and emerging topics. The first session will focus on classical research topics of ellipsometry as for instance optical coatings and inorganic thin films characterization. Furthermore, presentations on the ellipsometric investigation of novel optical and electronic materials and materials with subwavelength structures will be included. In the second oral session, we will host presentations on novel experimental and theoretical approaches including for instance imaging ellipsometry. The third oral session is dedicated to the application of Spectroscopic ellipsometry for the Characterization of Organic Films and Biological Materials. As a highlight, the best student paper, which is selected based on the quality of the research, its presentation, and the discussion during the symposium, will be awarded. A poster session is also planned.
EL-MoA: Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
- Maria Losurdo, Institute of Nanotechnology, CNR-NANOTEC, Italy, “Potential and Perspective of Ellipsometry in Phase Change Materials Science”
EL+TF-MoM: Optical Characterization of Thin Films and Nanostructures
- Christoph Cobet, Johannes Kepler Universität Linz, Austria, “In-Situ Optical Exploration of Electrochemically Induced Conformation Changes at Solid Liquid Interfaces – A Source of new Electronic Properties”
- Rüdiger Schmidt-Grund, Ilmenau University of Technology, Germany, “Spectroscopic Study of Cationic Order in Spinel Ferrite Thin Films”
EL-On Demand: Spectroscopic Ellipsometry On Demand Session
EL-TuP: Spectroscopic Ellipsometry Poster Session