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      • Divisions
        • AS: Applied Surface Science
        • BI: Biomaterial Interfaces
        • EM: Electronic Materials and Photonics
        • MI: Magnetic Interfaces and Nanostructures
        • NS: Nanoscale Science and Technology
        • PS: Plasma Science & Technology
        • SE: Advanced Surface Engineering
        • SS: Surface Science
        • TF: Thin Film
        • VT: Vacuum Technology
      • Focus Topics
        • 2D: 2D Materials
        • AC: Actinides and Rare Earths
        • AP: Atomic Scale Processing
        • CA: Chemical Analysis and Imaging at Interfaces
        • EL: Spectroscopic Ellipsometry
        • HC: Fundamental Discoveries in Heterogeneous Catalysis
        • HI: Advanced Ion Microscopy & Ion Beam Nano-Engineering
        • LD: Leaders in Energy and The Environment
        • LS: New Trends in Structural Electronic Characterization of Materials, Interfaces, and Surfaces Using Synchrotron and FEL Based Light Sources
        • QS: Materials and Processes for Quantum Information Science
        • SM: Smart Multifunctional Materials for Nanomedicine
      • Groups
        • MN: MEMS and NEMS Technology
        • MS: Manufacturing Science and Technology
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Division: Applied Surface Science (AS)

The Applied Surface Science Division provides a forum for research in surface preparation, modification, and utilization for practical applications with a focus on characterization of surfaces, interfaces, and nanomaterials.  The Division has long been the premier gathering place for the global community of surface analysts with historic emphasis on techniques such as XPS, SIMS, and Auger spectroscopies.  The Division has long-standing analytical interests with traditional sessions such as quantitative surface analysis, industrial problem solving, and advances in the development of techniques for surface analysis.  Our contributors present a blend of fundamental research in measurement science along with cutting-edge applied studies in areas such as nanoscience, materials for energy conversion, semiconductor processing, polymers, and biotechnology.  The Division strives to grow in new areas for future development in applied surface analysis and analytical data processing.  At AVS 67 the Division is sponsoring 8 oral sessions, a poster session, and an On Demand session (for presenters who will not be able to attend the symposium in-person).  Highlights include invited presentations by both the 2020 and 2021 Peter M.A. Sherwood Mid-Career Award winners, a memorial session for Charles S. Fadley, who passed away on August 1, 2019 and was a pioneer in the development of XPS, and the division’s Business Meeting and Awards Ceremony on Tuesday evening, October 26, 2021, which will include a module presentation by this year’s winner of the Division’s student award competition.

AS+AC+BI+CA-WeM: Analysis of Complex Systems with SIMS

  • Daniel Graham, University of Washington, Seattle, “Virtual Presentation: ASSD 2021 Peter M.A. Sherwood Mid-Career Professional Award Talk: Information from complexity – Making Sense of the Mess Created by ToF-SIMS”
  • Birgit Hagenhoff, Tascon GmbH, Germany, “Towards Organic 3D Characterization: SIMS Analysis Using Ar Cluster Ions”
  • Christopher Szakal, National Institue of Standards and Technology, “ASSD 2020 Peter M.A. Sherwood Mid-Career Professional Award Talk: Innovations in Biological, Nanoscale, and Nuclear Materials Analysis with SIMS”

AS+BI+CA+LS+NS+SE+SS-MoM: Analysis of Surfaces and Interfaces Related to Energy and the Environment I

  • Julia Maibach, Karlsruhe Institute of Technology (KIT), Institute for Applied Materials (IAM), Germany, “Batteries at Work: Ambient Pressure Photoelectron Spectroscopy for Lithium Ion Batteries”
  • Svitlana Pylypenko, Colorado School of Mines, “Analysis of Surfaces and Interfaces in Polymer Electrolyte Membrane Fuel Cell and Electrolyzer Devices”

AS+BI+CA+LS+NS+SE+SS-TuM: Analysis of Surfaces and Interfaces Related to Energy and the Environment II

  • Robyn Goacher, Materion Corp., “Going Beyond Superficial Surface Analysis for Transforming Plants into Value-added Products”

AS+BI+CA+LS+SS-MoA: Quantitative Surface Analysis I

  • David Cant, National Physical Laboratory, U.K., “Hard Targets : Developing Tools for Quantitative Haxpes”
  • Peter Licence, The University of Nottingham, UK, “Chemistry in-Vacuo: Suck It and See!”

AS+BI+CA+LS+SS-ThA: Quantitative Surface Analysis III

AS+BI+CA+LS+SS-TuA: Quantitative Surface Analysis II

  • Brian Gorman, Colorado School of Mines, “Hardware and Data Analysis Methods for Integrating TEM and Atom Probe Tomography”
  • Alexander Gray, Temple University, “Combining Multiple X-Ray Spectroscopic and Scattering Techniques to Probe Emergent Electronic Phenomena at Oxide Interfaces”

AS+HC+PS+SE+SM-ThA: Modification of Surfaces and Interfaces for Practical Applications

AS+SS-WeA: Charles S. Fadley Memorial Session (ALL INVITED SESSION)

  • María C. Asensio, Materials Science Institute of Madrid (ICMM), Spanish Scientific Research Council (CSIC), Spain, “The Role of Photoelectron Diffraction Effects on the Flat Surface State Bands Close to the Fermi Level: Revisiting the Si(111) 7×7 Surfaces”
  • Alexander Gray, Temple University, “Synergies between Synchrotron and Lab-Based X-Ray Techniques for the Studies of Complex Materials and Interfaces”
  • Martina Müller, University of Konstanz, Germany, “Electronic Structure of Tunable Ferroic Oxides Determined by Photoemission Spectroscopy”
  • Simon Mun, Gwangju Institute of Science and Technology, Korea (Republic of), “Study of Surface Chemical Reactions With Ambient Pressure XPS”
  • Inna Vishik, University of California at Davis, “High Resolution Angle-Resolved Photoemission Spectroscopy Studies of Quantum Materials”

AS-On Demand: Applied Surface Science On Demand Session

AS-ThP: Applied Surface Science Division Poster Session

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Key Dates

Awards Nominations Deadlines:
March 31, 2021
(Student May 3, 2021)

Abstract Submission Deadline:
June 1, 2021
(Late Breaking August 31, 2021)

Early Registration Deadline:
October 4, 2021

Downloads

  • Copyright Agreement (PDF)
  • Presentation Instructions (PDF)
  • Sponsorship Form (PDF)
  • Technical Program (PDF)
  • Viewing Instructions (PDF)

Contact

Yvonne Towse
Conference Administrator
125 Maiden Lane; Suite 15B
New York, N.Y. 10038
yvonne@avs.org

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