The Advanced Ion Microscopy & Ion Beam Nano-Engineering focus topic targets research in focused ion beam technology and applications, with emphasis on applying novel ion beam technologies – to deliver unique solutions in microscopy, nano-fabrication, metrology, materials engineering, and other analytical techniques. With origins in Gas Field Ion Source Helium Ion Microscopy (GFIS-HIM, this session has expanded to include the full spectrum gas particle beams and sources including Liquid Metal Ion Sources (LMIS), a breadth of solid state and alloy sources, plasma-cusp ion sources, cold beams, and neutral beams, for various use in research and application.
HI-ThA: Novel Beam Induced Material Engineering & Nano patterning
- Wolfgang Lang, University of Vienna, Austria, “Nanoscale Vortex Pinning Structures in High-Temperature Superconductors Created in a Helium Ion Microscope”
HI1-ThM: Advanced Ion Microscopy & Surface Analysis Applications
- Annalena Wolff, Queensland University of Technology (QUT), Australia, “Focused Ion Beams in Biology: Revealing Nature’s Tiniest Structures using the Helium Ion Microscope”
HI2-ThM: Emerging Ion Sources, Optics, and Applications
- Jiro Matsuo, Quantum Science and Engineering Center, Kyoto University, Japan, “Cluster Ion Beams: A New Tool for Characterization and Processing of Organic and Biological Materials”
HI-On Demand: Advanced Ion Microscopy & Nano-Engineering On Demand Session
HI-ThP: Advanced Ion Microscopy & Nano-Engineering Poster Session